Abstract
A single photodetector with tunable detection wavelengths and polarization sensitivity can potentially be harnessed for diverse optical applications ranging from imaging and sensing to telecommunications. Such a device will require the combination of multiple material systems with different structures, band gaps, and photoelectrical responses, which is extremely difficult to engineer using traditional epitaxial films. Here, we develop a multifunctional and high-performance photosensor using all van der Waals materials. The device features a gate-tunable spectral response that is switchable between near-infrared/visible and short-/midwave infrared, as well as broad-band operation, at room temperature. The linear polarization sensitivity in the telecommunication O-band can also be directly modulated between horizontal, vertical, and nonpolarizing modes. These effects originate from the balance of photocurrent generation in two of the active layers that can be manipulated by an electric field. The photodetector features high detectivity (>109 cmHz1/2W–1) together with fast operation speed (∼1 MHz) and can be further exploited for dual visible and infrared imaging.
© Shen, D., Yang, H., Patel, T., Rhodes, D. A., Timusk, T., Zhou, Y. N., Kim, N. Y., & Tsen, A. W. (2024). Gate-Tunable Multiband van der Waals Photodetector and Polarization Sensor. ACS Nano, 18(17), 11193–11199. https://doi.org/10.1021/acsnano.4c00181