Mastering Electrical Characterization Seminar
Event to be held on Tuesday, May 27, 2025, 9:00 AM – 1:00 PM, QNC 1501
The Quantum Nano Fabrication and Characterization Facility (QNFCF), Transformative Quantum Technologies (TQT) and Testforce will be hosting an Electrical Characterization Seminar joined by a Keithley Applications Engineer, who will explore the challenges and best practices in low current and low voltage measurements using the Keithley 4200A-SCS Parameter Analyzer.
Gain practical insights into optimizing their setups for device characterization, enhancing measurement accuracy, and overcoming noise, leakage, and connection limitations common in lab and wafer-level testing. Whether you’re testing nanoscale devices, advanced semiconductors, or novel materials, this seminar will give you the knowledge to get the most out of your instrumentation.
This seminar is open to students, staff, faculty, and industry professionals.
Topical outline:
- DC I-V Characterization Fundamentals: Understanding SMU operation
- Voltage Measurement Challenges and Solutions: Noise floor and source loading issues
- Low Current Measurement Techniques: Common error sources, including triboelectric effects, contamination, leakage
- Best Practices for Cabling, Cables, and Probing
- Applications in Semiconductor & Research Labs
* Topics are subject to change.
Lunch will be provided. We hope you will join us. Please register for the event.